V. W. S. Chan

A 0.13 μm CMOS System-on-Chip for a 512 × 424 Time-of-Flight Image Sensor With Multi-Frequency Photo-Demodulation up to 130 MHz and 2 GS/s ADC

Cyrus Bamji, Patrick A. O’Connor, Tamer A. Elkhatib et al. · IEEE Journal of Solid-State Circuits · 2014 · 191 citations · Full text

Engineering, Time-of-flight Camera, Tof Sensor +12

IMpixel 65nm BSI 320MHz demodulated TOF Image sensor with 3μm global shutter pixels and analog binning

Cyrus Bamji, Swati Mehta, Barry Thompson et al. · 2018 · 122 citations

Engineering, Analog Binning, Image Sensor +17

Principles of digital communication and coding

V. W. S. Chan · Proceedings of the IEEE · 1981 · 86 citations

Engineering, Arts, Modulation Coding +6

Two-stage hot-carrier degradation and its impact on submicrometer LDD NMOSFET lifetime prediction

V. W. S. Chan, J.E. Chung · IEEE Transactions on Electron Devices · 1995 · 84 citations

Electrical Engineering, Degradation Rate Coefficient, Engineering +10

7.6 A 512×424 CMOS 3D Time-of-Flight image sensor with multi-frequency photo-demodulation up to 130MHz and 2GS/s ADC

Andrew D. Payne, Andy Daniel, Anik Mehta et al. · 2014 · 58 citations

Engineering, Education, Depth Map +22