Yudong Hao

Device based in-chip critical dimension and overlay metrology

Young‐Nam Kim, Jong-Sun Paek, Silvio Rabello et al. · Optics Express · 2009 · 50 citations · Full text

Engineering, Electrical Engineering, Manufacturing Engineering +17

Thermal-induced surface plasmon band shift of gold nanoparticle monolayer: morphology and refractive index sensitivity

Xuemin Zhang, Junhu Zhang, Huan Wang et al. · Nanotechnology · 2010 · 48 citations

Natural Sciences, Materials Engineering, Materials Science +17

Multifrequency grating projection profilometry based on the nonlinear excess fraction method

Yudong Hao, Yang Zhao, Dacheng Li · Applied Optics · 1999 · 44 citations

Engineering, Materials Engineering, Digital Imaging +16

Elliptical Silicon Arrays with Anisotropic Optical and Wetting Properties

Tieqiang Wang, Xiao Li, Junhu Zhang et al. · Langmuir · 2010 · 37 citations

Engineering, Materials Engineering, Materials Science +17

Research of livestock farming IoT system based on RESTful web services

Liwu Pan, Mingzhe Xu, Lei Xi et al. · 2016 · 23 citations

Computing, Computer Systems, Agricultural Automation +16