Bernhard Büttgen

Analyzing the Radiation Degradation of 4-Transistor Deep Submicron Technology CMOS Image Sensors

Jiaming Tan, Bernhard Büttgen, Albert Theuwissen · IEEE Sensors Journal · 2012 · 55 citations

Electrical Engineering, Photoelectric Sensor, Engineering +13

Novel pixel architecture with inherent background suppression for 3D time-of-flight imaging

Thierry Oggier, R. Kaufmann, Michael Lehmann et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2005 · 39 citations

Engineering, Sparse Imaging, Image Sensor +18

Feedforward Effect in Standard CMOS Pinned Photodiodes

Mukul Sarkar, Bernhard Büttgen, Albert Theuwissen · IEEE Transactions on Electron Devices · 2013 · 29 citations

Photonics, Electrical Engineering, Photoelectric Sensor +12

Optimization of Pinned Photodiode Pixels for High-Speed Time of Flight Applications

Fabio Acerbi, Manuel Moreno-García, Gözen Köklü et al. · IEEE Journal of the Electron Devices Society · 2018 · 26 citations · Full text

Engineering, Flight Applications, Image Sensor +18

Demonstration of a novel drift field pixel structure for the demodulation of modulated light waves with application in three-dimensional image capture

Bernhard Büttgen, Thierry Oggier, R. Kaufmann et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2004 · 20 citations

Engineering, Wave Optic, Image Sensor +16