I. M. P. Aarts

Optical second-harmonic generation in thin film systems

J. J. H. Gielis, P. M. Gevers, I. M. P. Aarts et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2008 · 45 citations · Full text

Optical Materials, Engineering, Nonlinear Optics +19

Direct and highly sensitive measurement of defect-related absorption in amorphous silicon thin films by cavity ringdown spectroscopy

I. M. P. Aarts, Bram Hoex, Arno H. M. Smets et al. · Applied Physics Letters · 2004 · 40 citations · Full text

Optical Materials, Engineering, Absorption Spectroscopy +19

Spectroscopic second harmonic generation measured on plasma-deposited hydrogenated amorphous silicon thin films

W. M. M. Kessels, J. J. H. Gielis, I. M. P. Aarts et al. · Applied Physics Letters · 2004 · 23 citations · Full text

Optical Materials, Engineering, Silicon On Insulator +16

Probing hydrogenated amorphous silicon surface states by spectroscopic and real-time second-harmonic generation

I. M. P. Aarts, J. J. H. Gielis, M. C. M. van de Sanden et al. · Physical Review B · 2006 · 21 citations · Full text

Semiconductors, Optical Materials, Engineering +15

Absence of the enhanced intra-4f transition cross section at 1.5μm of Er3+ in Si-rich SiO2

Hans Mertens, Albert Polman, I. M. P. Aarts et al. · Applied Physics Letters · 2005 · 19 citations · Full text

Optical Materials, Engineering, Er3+ I15∕24−i13∕24 Transition +19