C. C. Beh is an author at IBM (United States) specializing in engineering, software testing, and computer engineering.
Top concepts
EngineeringSoftware TestingReliabilityVlsi DesignFailure AnalysisMicroelectronicsHardware SecurityBuilt-in Self-testDesign For TestingParallel Computing
Publications per year
1982–1990
2
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Do Stuck Fault Models Reflect Manufacturing Defects
C. C. Beh, K. H. Arya, Charles E. Radke et al. · International Test Conference · 1982 · 60 citations
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