Charles E. Radke

Do Stuck Fault Models Reflect Manufacturing Defects

C. C. Beh, K. H. Arya, Charles E. Radke et al. · International Test Conference · 1982 · 60 citations

Reliability, Reliability Engineering, Engineering +4

The use of quadratic residue research

Charles E. Radke · Communications of the ACM · 1970 · 33 citations · Full text

Engineering, Discrete Event Systems, Simulation +19

A logic chip delay-test method based on system timing

Franco Motika, N. Tendolkar, C. C. Beh et al. · IBM Journal of Research and Development · 1990 · 19 citations

Hardware Security, Level-sensitive Scan Design, Engineering +14

A justification of, and an improvement on, a useful rule for predicting circuit-to-pin ratios

Charles E. Radke · 1969 · 16 citations · Full text

Circuit-to-pin Ratios, Electrical Engineering, Physical Design (Electronics) +12

Proceedings of the 17th Design Automation Conference

Edwin B. Hassler, R. J. Smith, P. O. Pistilli et al. · 1980 · 16 citations

Architectural Design, Industrial Design, Engineering +9