O. Semenov

Impact of Self-Heating Effect on Long-Term Reliability and Performance Degradation in CMOS Circuits

O. Semenov, A. Vassighi, Manoj Sachdev · IEEE Transactions on Device and Materials Reliability · 2006 · 179 citations

Engineering, Vlsi Design, Energy Efficiency +21

Impact of gate induced drain leakage on overall leakage of submicrometer CMOS VLSI circuits

O. Semenov, A.H. Pradzynski, Manoj Sachdev · IEEE Transactions on Semiconductor Manufacturing · 2002 · 49 citations

Hardware Security, Electrical Engineering, Engineering +9

Impact of technology scaling on thermal behavior of leakage current in sub-quarter micron MOSFETs: perspective of low temperature current testing

O. Semenov, A. Vassighi, Manoj Sachdev · Microelectronics Journal · 2002 · 39 citations

CMOS IC Technology Scaling and Its Impact on Burn-In

A. Vassighi, O. Semenov, Manoj Sachdev et al. · IEEE Transactions on Device and Materials Reliability · 2004 · 38 citations

Engineering, Vlsi Design, Computer Architecture +16

Effect of cmos technology scaling on thermal management during burn-in

O. Semenov, A. Vassighi, Manoj Sachdev et al. · IEEE Transactions on Semiconductor Manufacturing · 2003 · 32 citations

Engineering, Vlsi Design, Energy Efficiency +21