Jou-Miao Shih

NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain

Chia-Sheng Lin, Ying-Chung Chen, Ting‐Chang Chang et al. · IEEE Electron Device Letters · 2011 · 42 citations

Engineering, Electrical Engineering, Materials Science +16

Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors

Chih-Hao Dai, Ting‐Chang Chang, Ann‐Kuo Chu et al. · Applied Physics Letters · 2011 · 36 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Impact of static and dynamic stress on threshold voltage instability in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors

Chih-Hao Dai, Ting‐Chang Chang, Ann‐Kuo Chu et al. · Applied Physics Letters · 2011 · 25 citations

Engineering, Electrical Engineering, Materials Science +17

On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETs

Chih-Hao Dai, Ting‐Chang Chang, Yuan-Jui Kuo et al. · IEEE Electron Device Letters · 2011 · 19 citations

Engineering, Electrical Engineering, Microelectronics +16