H. C. Ha

Demonstration of a 600-V, 60-A, bidirectional silicon carbide solid-state circuit breaker

Damian Urciuoli, Victor Veliadis, H. C. Ha et al. · 2011 · 71 citations · Full text

Engineering, Electrical Engineering, Microelectronics +15

Reliable Operation of SiC JFET Subjected to Over 2.4 Million 1200-V/115-A Hard Switching Events at 150 $^{\circ}\hbox{C}$

Victor Veliadis, B. Steiner, Kevin Lawson et al. · IEEE Electron Device Letters · 2013 · 30 citations

Engineering, Electrical Engineering, Materials Science +15

Degradation and Full Recovery in High-Voltage Implanted-Gate SiC JFETs Subjected to Bipolar Current Stress

Victor Veliadis, Harold Hearne, Eric J. Stewart et al. · IEEE Electron Device Letters · 2012 · 28 citations

Engineering, Electrical Engineering, Materials Science +16

Hard-Switch Stressing of Vertical-Channel Implanted-Gate SiC JFETs

Kevin Lawson, Gema Molina Alvarez, Stephen Bayne et al. · IEEE Electron Device Letters · 2011 · 23 citations

Engineering, Electrical Engineering, Materials Science +15

600-V / 2-A Symmetrical Bi-Directional Power Flow Using Vertical-Channel JFETs Connected in Common Source Configuration

Victor Veliadis, Damian Urciuoli, Harold Hearne et al. · Materials science forum · 2010 · 23 citations

Engineering, Electrical Engineering, Microelectronics +13