Hyung Suk Jung

Stabilization of Tetragonal HfO₂ under Low Active Oxygen Source Environment in Atomic Layer Deposition

Deok‐Yong Cho, Hyung Suk Jung, Il-Hyuk Yu et al. · Chemistry of Materials · 2012 · 110 citations

Natural Sciences, Materials Engineering, Materials Science +17

Improved Growth and Electrical Properties of Atomic-Layer-Deposited Metal-Oxide Film by Discrete Feeding Method of Metal Precursor

Tae Joo Park, Jeong Hwan Kim, Jae Hyuck Jang et al. · Chemistry of Materials · 2011 · 40 citations

Natural Sciences, Materials Engineering, Materials Science +17

The effects of device geometry on the negative bias temperature instability of Hf-In-Zn-O thin film transistors under light illumination

Jeong Hwan Kim, Un Ki Kim, Yoon Jang Chung et al. · Applied Physics Letters · 2011 · 17 citations

Engineering, Electrical Engineering, Materials Science +17

Direct Observation of Hole Current in Amorphous Oxide Semiconductors under Illumination

Yoon Jang Chung, Jeong Hwan Kim, Un Ki Kim et al. · Electrochemical and Solid-State Letters · 2011 · 15 citations

Engineering, Electrical Engineering, Materials Science +15

Effects of Annealing Environment on Interfacial Reactions and Electrical Properties of Ultrathin SrTiO[sub 3] on Si

Tae Joo Park, Jeong Hwan Kim, Jae Hyuck Jang et al. · Journal of The Electrochemical Society · 2009 · 10 citations

Natural Sciences, Materials Engineering, Materials Science +17