Eiichi Nomura

Structure analysis of the Si(111)√3 × √3<i>R</i>30°-Ag surface

M. Katayama, R. Stanley Williams, Masahiko Katô et al. · Physical Review Letters · 1991 · 207 citations

Engineering, Intratrimer Ag-ag Distance, Chemistry +16

Coaxial impact-collision ion scattering spectroscopy (CAICISS): A novel method for surface structure analysis

M. Katayama, Eiichi Nomura, Norio Kanekama et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1988 · 206 citations

Surface Structure Analysis, Novel Method, Engineering +11

An Embedded Device Technology Based on a Molded Reconfigured Wafer

Markus Brunnbauer, E. Furgut, G. Beer et al. · 2006 · 174 citations

Engineering, Device Integration, Mechanical Engineering +23

Recent developments in low-energy ion scattering spectroscopy (ISS) for surface structural analysis

Masakazu Aono, M. Katayama, Eiichi Nomura et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1989 · 83 citations

Surface Characterization, Engineering, Low-energy Ion +12

Nanometer-scale resolution of calixarene negative resist in electron beam lithography

Jun‐ichi Fujita, Y. Ohnishi, Yukinori Ochiai et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 65 citations

Engineering, Electron-beam Lithography, Microscopy +25