C. R. Musil

The focused ion beam as an integrated circuit restructuring tool

J. Melngailis, C. R. Musil, E.H. Stevens et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1986 · 82 citations

Engineering, Materials Engineering, Materials Science +11

Direct growth of nanostructures by deposition through an Si3N4 shadow mask

J. Köhler, M. Albrecht, C. R. Musil et al. · Physica E Low-dimensional Systems and Nanostructures · 1999 · 49 citations

Natural Sciences, Materials Engineering, Materials Science +12

Surface tracks by MeV C60 impacts on mica and PMMA

M. Döbeli, F. Ames, C. R. Musil et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1998 · 29 citations

Engineering, Materials Science, Microfabrication +4

Finite element calculations and fabrication of cantilever sensors for nanoscale detection

J.-H. Fabian, L. Scandella, H. Fuhrmann et al. · Ultramicroscopy · 2000 · 24 citations

Engineering, Materials Science, Mechanical Engineering +16

Phonon thermal conductivity of amorphous selenium doped by germanium

L. Štourač, A. Vaško, I. Srb et al. · Czechoslovak Journal of Physics · 1968 · 24 citations

Natural Sciences, Materials Science, Physics +14