Kyongsik Yeom is an author at Samsung (South Korea) specializing in electrical engineering, microelectronics, and engineering.
Top concepts
EngineeringMicroelectronicsElectrical EngineeringVlsi DesignMemory DevicesApplied PhysicsNanoelectronicsIntegrated CircuitsComputer EngineeringComputer Architecture
Publications per year
2002–2017
2
2
Gate oxide integrity (GOI) of MOS transistors with W/TiN stacked gate
D.H. Lee, Kyongsik Yeom, M.H. Cho et al. · 2002 · 13 citations
Materials Engineering, Pmos Transistors, Electrical Engineering +11
Rows per page
1–2 of 2