J.-J. Yang

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Publications

Citations

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Active since

1995

Affiliations

National Yang Ming Chiao Tung University(Current)

Taiwan Semiconductor Manufacturing Company (Taiwan)

Chang Gung University

J.-J. Yang is an author at National Yang Ming Chiao Tung University specializing in semiconductor reliability, semiconductor devices, and microelectronics.

Publications per year

1995–2006

Publications

Impact of STI on the Reliability of Narrow-Width pMOSFETs With Advanced ALD N/O Gate Stack

Steve S. Chung, Chih‐Hua Yeh, Hsien-Tsung Feng et al. · IEEE Transactions on Device and Materials Reliability · 2006 · 18 citations

Engineering, Electrical Engineering, Materials Science +17

A new approach for characterizing structure-dependent hot-carrier effects in drain-engineered MOSFET's

Steve S. Chung, J.-J. Yang · IEEE Transactions on Electron Devices · 1999 · 17 citations

Engineering, Electrical Engineering, Electronic Materials +16

Localization of NBTI-induced oxide damage in direct tunneling regime gate oxide pMOSFET using a novel low gate-leakage gated-diode (L/sup 2/-GD) method

Steve S. Chung, D.K. Lo, J.-J. Yang et al. · 2003 · 14 citations

Engineering, Electrical Engineering, Microelectronics +16

A new physical and quantitative width dependent hot carrier model for shallow-trench-isolated CMOS devices

Steve S. Chung, S.-J. Chen, W.-J. Yang et al. · 2002 · 13 citations

Engineering, Computer Engineering, Electrical Engineering +17

A new approach to modeling the substrate current of pre-stressed and post-stressed MOSFET's

J.-J. Yang, Steve S. Chung, Peng-Cheng Chou et al. · IEEE Transactions on Electron Devices · 1995 · 11 citations

Engineering, Electrical Engineering, Microelectronics +16

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