R. Hu

Raman and Rutherford backscattering analyses of cubic SiC thin films grown on Si by vertical chemical vapor deposition

Zhe Chuan Feng, C. C. Tin, R. Hu et al. · Thin Solid Films · 1995 · 41 citations

Engineering, Materials Engineering, Materials Science +16

Reduction of etch pits in heteroepitaxial growth of 3CSiC on silicon

C. C. Tin, R. Hu, R. Coston et al. · Journal of Crystal Growth · 1995 · 28 citations

Engineering, Materials Engineering, Materials Science +14

Surface chemical states on 3C-SiC/Si epilayers

Andrew T. S. Wee, Zhe Chuan Feng, Huey Hoon Hng et al. · Applied Surface Science · 1994 · 23 citations

Natural Sciences, Materials Engineering, Materials Science +14

Structural, optical, and surface science studies of 4H-SiC epilayers grown by low pressure chemical vapor deposition

Zhe Chuan Feng, A. Rohatgi, C. C. Tin et al. · Journal of Electronic Materials · 1996 · 19 citations

Engineering, Materials Engineering, Materials Science +16

Organic Indium Halides with Near-Unity Photoluminescence Quantum Yields for Highly Efficient Luminescent Inks and White Light Emitting Diodes

Qi Wang, Wei Jiang, T Liu et al. · ACS Applied Materials & Interfaces · 2025 · 10 citations

Natural Sciences, Chemistry, Materials Science +17