Joo-Tae Moon

Fabrication and Device Characterization of Omega-Shaped-Gate ZnO Nanowire Field-Effect Transistors

Kihyun Keem, Dong‐Young Jeong, Sangsig Kim et al. · Nano Letters · 2006 · 146 citations

Engineering, Electrical Engineering, Materials Science +17

8Gb MLC (Multi-Level Cell) NAND flash memory using 63nm process technology

Jong‐Ho Park, Sung‐Hoi Hur, Joun-Hee Lee et al. · 2005 · 53 citations

Engineering, Computer Engineering, Electrical Engineering +13

Effect of line-edge roughness (LER) and line-width roughness (LWR) on sub-100-nm device performance

Ji-Young Lee, Jangho Shin, Hyunwoo Kim et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2004 · 43 citations

Engineering, Electrical Engineering, Materials Science +17

1D thickness scaling study of phase change material (Ge<inf>2</inf>Sb<inf>2</inf>Te<inf>5</inf>) using a pseudo 3-terminal device

Byoung-Jae Bae, Sang‐Bum Kim, Yuan Zhang et al. · 2009 · 16 citations

Natural Sciences, Electrical Engineering, Materials Science +15

Selective growth of carbon nanotube for via interconnects by oxidation and selective reduction of catalyst

Sunwoo Lee, Seongho Moon, Hong Sik Yoon et al. · Applied Physics Letters · 2008 · 15 citations

Engineering, Materials Engineering, Materials Science +12