Roger D. Meredith

Stable Electrical Operation of 6H–SiC JFETs and ICs for Thousands of Hours at 500 $^{\circ}\hbox{C}$

Philip G. Neudeck, David J. Spry, Liang-Yü Chen et al. · IEEE Electron Device Letters · 2008 · 128 citations

Engineering, Electrical Engineering, Materials Science +17

Operational Testing of 4H-SiC JFET ICs for 60 Days Directly Exposed to Venus Surface Atmospheric Conditions

Philip G. Neudeck, Liangyu Chen, Roger D. Meredith et al. · IEEE Journal of the Electron Devices Society · 2018 · 71 citations · Full text

Engineering, Electrical Engineering, Materials Science +15

Prolonged silicon carbide integrated circuit operation in Venus surface atmospheric conditions

Philip G. Neudeck, Roger D. Meredith, Liang-Yü Chen et al. · AIP Advances · 2016 · 69 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +13

Fabrication and Testing of 6H-SiC JFETs for Prolonged 500 °C Operation in Air Ambient

David J. Spry, Philip G. Neudeck, Liangyu Chen et al. · Materials science forum · 2008 · 23 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

6H-SiC Transistor Integrated Circuits Demonstrating Prolonged Operation at 500 C

Philip G. Neudeck, David J. Spry, Liang-Yü Chen et al. · NASA Technical Reports Server (NASA) · 2008 · 23 citations

Engineering, Aerospace Engineering, Electrical Engineering +17