A. S. Hou

Picosecond electrical sampling using a scanning force microscope

A. S. Hou, F. Ho, D. M. Bloom · Electronics Letters · 1992 · 117 citations

Microscope Tip, Engineering, Microscopy +18

Scanning probe microscopy for testing ultrafast electronic devices

A. S. Hou, Bettina Nechay, F. Ho et al. · Optical and Quantum Electronics · 1996 · 38 citations

Electronic Devices, Engineering, Microscopy +8

Tapping mode atomic force microscopy using electrostatic force modulation

Junsung Hong, Z. G. Khim, A. S. Hou et al. · Applied Physics Letters · 1996 · 29 citations

Engineering, Microscopy, Soft Matter +16

Applications of an atomic force microscope voltage probe with ultrafast time resolution

Bettina Nechay, F. Ho, A. S. Hou et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1995 · 22 citations

Engineering, Microscopy, Temporal Response +20

Harmonic mode locking of a Nd:BEL laser using a 20-GHz dielectric resonator/optical modulator

A. A. Godil, A. S. Hou, B. A. Auld et al. · Optics Letters · 1991 · 22 citations

Optical Pumping, Photonics, Active Mode Locking +13