F. Ho

Picosecond electrical sampling using a scanning force microscope

A. S. Hou, F. Ho, D. M. Bloom · Electronics Letters · 1992 · 117 citations

Microscope Tip, Engineering, Microscopy +18

Mechanical parametric amplification in piezoresistive gallium arsenide microcantilevers

Aykutlu Dâna, F. Ho, Y. Yamamoto · Applied Physics Letters · 1998 · 48 citations

Engineering, Microscopy, Mechanical Engineering +17

Scanning probe microscopy for testing ultrafast electronic devices

A. S. Hou, Bettina Nechay, F. Ho et al. · Optical and Quantum Electronics · 1996 · 38 citations

Electronic Devices, Engineering, Microscopy +8

Applications of an atomic force microscope voltage probe with ultrafast time resolution

Bettina Nechay, F. Ho, A. S. Hou et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1995 · 22 citations

Engineering, Microscopy, Temporal Response +20

High-speed integrated circuit probing using a scanningforcemicroscope sampler

F. Ho, A. S. Hou, D. M. Bloom · Electronics Letters · 1994 · 13 citations