Yu Gyun Shin

Evolution of NAND Flash Memory: From 2D to 3D as a Storage Market Leader

Hyun‐Suk Kim, Su-Jin Ahn, Yu Gyun Shin et al. · 2017 · 122 citations

Engineering, Computer Engineering, Computer Systems +16

Comprehensive Design Guidelines of Gate Stack for QLC and Highly Reliable Ferroelectric VNAND

Suhwan Lim, Taeyoung Kim, Ilho Myeong et al. · 2023 · 54 citations

Engineering, Computer Engineering, Electrical Engineering +17

A new ruler on the storage market: 3D-NAND flash for high-density memory and its technology evolutions and challenges on the future

Jae Hoon Jang, Junhee Lim, Yu Gyun Shin et al. · 2016 · 47 citations

Engineering, Computer Engineering, Electrical Engineering +16

First demonstration of 3-dimensional stacked FET with top/bottom source-drain isolation and stacked n/p metal gate

Jaehyun Park, Wu-Kang Kim, Sung-Il Park et al. · 2023 · 35 citations

Engineering, Electrical Engineering, Microelectronics +16

Highly Manufacturable, Cost-Effective, and Monolithically Stackable 4F² Single-Gated IGZO Vertical Channel Transistor (VCT) for sub-10nm DRAM

Daewon Ha, Wonsok Lee, M.H. Cho et al. · 2023 · 26 citations

Engineering, Electrical Engineering, Microelectronics +15