Paul Moses

The wafer flexure technique for the determination of the transverse piezoelectric coefficient (d31) of PZT thin films

J. Shepard, Paul Moses, Susan Trolier‐McKinstry · Sensors and Actuators A Physical · 1998 · 192 citations

Natural Sciences, Electrical Engineering, Materials Science +12

Piezoelectric accelerometers for ultrahigh temperature application

Shujun Zhang, Xiaoning Jiang, Michael Ian Lapsley et al. · Applied Physics Letters · 2010 · 136 citations

Engineering, Materials Science, Mechanical Engineering +15

Charge release of lanthanum-doped lead zirconate titanate stannate antiferroelectric thin films

Baomin Xu, Paul Moses, Neelesh G. Pai et al. · Applied Physics Letters · 1998 · 128 citations

Natural Sciences, Materials Engineering, Materials Science +14

Simple, high-resolution interferometer for the measurement of frequency-dependent complex piezoelectric responses in ferroelectric ceramics

Jiefang Li, Paul Moses, D. Viehland · Review of Scientific Instruments · 1995 · 69 citations

Natural Sciences, Materials Engineering, Materials Science +17

Converse electrostriction in polymers and composites

Sylvie M.-L. Eury, Rattikorn Yimnirun, V. Sundar et al. · Materials Chemistry and Physics · 1999 · 59 citations

Natural Sciences, Materials Engineering, Materials Science +12