The wafer flexure technique for the determination of the transverse piezoelectric coefficient (d31) of PZT thin films

Formulas for Stress and Strain

Raymond J. Roark, W. C. Young, R. Plunkett · Journal of Applied Mechanics · 1976 · 1.9K citations · Full text

Natural Sciences, Materials Engineering, Materials Science +10

Calculated elastic constants for stress problems associated with semiconductor devices

William A. Brantley · Journal of Applied Physics · 1973 · 1.2K citations

Natural Sciences, Materials Engineering, Materials Science +17

Measurement of piezoelectric coefficients of ferroelectric thin films

K. Lefki, G. J. M. Dormans · Journal of Applied Physics · 1994 · 591 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Formulas for stress and strain

M R HORNE · Journal of the Mechanics and Physics of Solids · 1954 · 529 citations

Natural Sciences, Materials Engineering, Materials Science +10

Interferometric measurements of electric field-induced displacements in piezoelectric thin films

Andréi L. Kholkin, Ch. Wütchrich, D. V. Taylor et al. · Review of Scientific Instruments · 1996 · 414 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +15