Statistics
Publications
1
Citations
235
H-Index
1
Active since
2005
Affiliations
F. Perrier is an author at Centre National de la Recherche Scientifique specializing in device characterization, electronic materials, and semiconductor reliability.
Publications per year
2005–2005
1
1
On-the-flycharacterization of NBTI in ultra-tihin gate oxide PMOSFET's
M. Denais, A. Bravaix, V. Huard et al. · 2005 · 235 citations
Engineering, Electrical Engineering, Electronic Materials +16
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