D.J. Dumin

Correlation of stress-induced leakage current in thin oxides with trap generation inside the oxides

D.J. Dumin, Jay R. Maddux · IEEE Transactions on Electron Devices · 1993 · 222 citations

Engineering, Electrical Engineering, Electronic Materials +14

A model relating wearout to breakdown in thin oxides

D.J. Dumin, Jay R. Maddux, R.S. Scott et al. · IEEE Transactions on Electron Devices · 1994 · 137 citations

Engineering, Electrical Engineering, Materials Science +17

High field related thin oxide wearout and breakdown

D.J. Dumin, S. Mopuri, S. Vanchinathan et al. · IEEE Transactions on Electron Devices · 1995 · 105 citations

Engineering, Materials Engineering, Materials Science +17

Thickness dependence of stress-induced leakage currents in silicon oxide

E.F. Runnion, S.M. Gladstone, R.S. Scott et al. · IEEE Transactions on Electron Devices · 1997 · 90 citations

Engineering, Electrical Engineering, Materials Science +17

Properties of Gallium Arsenide Diodes between 4.2° and 300°K

D.J. Dumin, G. L. Pearson · Journal of Applied Physics · 1965 · 86 citations

Engineering, Electrical Engineering, Materials Science +17