Peter Williams

Oxygen-induced segregation effects in sputter depth-profiling

Steven M. Hues, Peter Williams · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1986 · 38 citations

Natural Sciences, Materials Engineering, Materials Science +14

Testing and evaluation of web bearing capacity of corroded steel bridge girders

Amanda Bao, Caleb Guillaume, Christopher Satter et al. · Engineering Structures · 2021 · 31 citations

Engineering, Civil Engineering, Materials Science +14

Broad Scope Secondary Ion Mass Spectrometry

George R. Pettit, Cedric W. Holzapfel, Gordon M. Cragg et al. · Journal of Natural Products · 1983 · 19 citations

Natural Sciences, Chemistry, Analytical Chemistry +6

Secondary ion yield matrix effects in SIMS depth profiles of Si/Ge multilayers

Greg Gillen, J.M. Phelps, Randall W. Nelson et al. · Surface and Interface Analysis · 1989 · 19 citations

Natural Sciences, Materials Engineering, Materials Science +14

Quantitative measurement of O/Si ratios in oxygen-sputtered silicon using implant standards

Richard C. Sobers, Klaus Franzreb, Peter Williams · Applied Surface Science · 2004 · 18 citations

Natural Sciences, Materials Engineering, Materials Science +13