Jean‐Luc Muraro

Reliability modeling of capacitive RF MEMS

S. Mellé, D. De Conto, David Dubuc et al. · IEEE Transactions on Microwave Theory and Techniques · 2005 · 102 citations

Electrical Engineering, Reliability Engineering, Engineering +14

Failure predictive model of capacitive RF-MEMS

S. Mellé, D. De Conto, Laurent Mazenq et al. · Microelectronics Reliability · 2005 · 44 citations

Electrical Engineering, Engineering, Radio Frequency +4

GaN for space application: almost ready for flight

Jean‐Luc Muraro, Guillaume Nicolas, Do Minh Nhut et al. · International Journal of Microwave and Wireless Technologies · 2010 · 31 citations

Wide-bandgap Semiconductor, Engineering, Space Application +19

Modeling of the dielectric charging kinetic for capacitive RF-MEMS

S. Mellé, D. De Conto, Laurent Mazenq et al. · IEEE MTT-S International Microwave Symposium Digest, 2005. · 2005 · 29 citations

Electrical Engineering, Dielectrics, Engineering +11

Investigation of dielectric degradation of microwave capacitive microswitches

S. Mellé, F. Flourens, David Dubuc et al. · 2004 · 23 citations

Screening Effects, Electrical Engineering, Engineering +11