Concepedia

Publication | Closed Access

Failure predictive model of capacitive RF-MEMS

DOI

44

Citations

7

References

2005

Year

S. Mellé, D. De Conto, Laurent Mazenq, David Dubuc, B. Poussard, C. Bordas, Katia Grenier, L. Bary, O. Vendier, Jean‐Luc Muraro,
Microelectronics Reliability

References

YearCitations

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