Frank

Monte Carlo simulation of a 30 nm dual-gate MOSFET: how short can Si go?

Frank, Laux, Fischetti · 1992 · 266 citations

Engineering, Vlsi Design, Nanoelectronics +16

Increasing threshold voltage variation due to random telegraph noise in FETs as gate lengths scale to 20 nm

Tega, Miki, Pagette et al. · Symposium on VLSI Technology · 2009 · 109 citations

Device Modeling, Threshold Voltage Variation, Electrical Engineering +10

Nanoparticles isolated from blood: a reflection of vesiculability of blood cells during the isolation process

Šuštar, Bedina-Zavec, Stukelj et al. · International Journal of Nanomedicine · 2011 · 63 citations · Full text

environmental issues from coal mining and their solutions

Bian, Zheng-fu, Inyang et al. · 矿业科学技术：英文版 · 2010 · 50 citations

Coal Mining, Mining Environment, Clean Coal Technology +5

Characterization of a New IgE‐Binding 35‐kDa Protein from Birch Pollen with Cross‐Reacting Homologues in Various Plant Foods

Vieths, Frank, Stephan Scheurer et al. · Scandinavian Journal of Immunology · 1998 · 49 citations