Statistics
Publications
2
Citations
286
H-Index
2
Active since
1992
Affiliations
Laux is an author at IBM Research - Thomas J. Watson Research Center specializing in device modeling, engineering, and applied physics.
Publications per year
1992–1992
2
2
Monte Carlo simulation of a 30 nm dual-gate MOSFET: how short can Si go?
Monte Carlo study of electron transport in silicon inversion layers
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