Sanghoon Shin

A 1.2 V 20 nm 307 GB/s HBM DRAM With At-Speed Wafer-Level IO Test Scheme and Adaptive Refresh Considering Temperature Distribution

Kyomin Sohn, Won-Joo Yun, Reum Oh et al. · IEEE Journal of Solid-State Circuits · 2016 · 62 citations

Engineering, Computer Engineering, High-performance Computing +15

18.2 A 1.2V 20nm 307GB/s HBM DRAM with at-speed wafer-level I/O test scheme and adaptive refresh considering temperature distribution

Kyomin Sohn, Won-Joo Yun, Reum Oh et al. · 2016 · 33 citations

Engineering, Computer Engineering, High-performance Computing +16

Piezoelectric and dielectric properties of B2O3-added (Ba0.85Ca0.15)(Ti0.915Zr0.085)O3 ceramics sintered at low temperature

Sanghoon Shin, Jong-Dae Han, Ju-Hyun Yoo · Materials Letters · 2015 · 28 citations

Natural Sciences, Materials Engineering, Materials Science +15

Tilt Aberration Compensation Using Interference Patterns in Digital Holography

Hyungjun Cho, Doo-Cheol Kim, Younghun Yu et al. · Journal of the Optical Society of Korea · 2009 · 19 citations · Full text

Natural Sciences, Vision Science, Biomedical Optics +15

Fine Metal Mask 3-Dimensional Measurement by using Scanning Digital Holographic Microscope

Sanghoon Shin, Younghun Yu · Journal of the Korean Physical Society · 2018 · 17 citations

Engineering, Manufacturing Engineering, 3D Modeling +13