V.K. Gueorguiev

Study of leakage current in n-channel and p-channel polycrystalline silicon thin-film transistors by conduction and low frequency noise measurements

Constantinos T. Angelis, C.A. Dimitriadis, I. Samaras et al. · Journal of Applied Physics · 1997 · 74 citations

Engineering, Electrical Engineering, Materials Science +17

Structure and morphology of thin SnO2 films

L. Popova, Michail Michailov, V.K. Gueorguiev et al. · Thin Solid Films · 1990 · 46 citations

Natural Sciences, Materials Engineering, Materials Science +12

Silicon ion implanted PMMA for soft electronics

Georgi B. Hadjichristov, V.K. Gueorguiev, T. Ivanov et al. · Organic Electronics · 2008 · 33 citations

Engineering, Materials Engineering, Materials Science +12

Conduction and low-frequency noise in high temperature processed polycrystalline silicon thin film transistors

C.A. Dimitriadis, J. Brini, G. Kamarinos et al. · Journal of Applied Physics · 1998 · 24 citations

Engineering, Electrical Engineering, Materials Science +17

Poole-Frenkel conduction in Al/ZrO2 /SiO 2 /Si structures

P. V. Aleskandrova, V.K. Gueorguiev, T. Ivanov et al. · The European Physical Journal B · 2006 · 23 citations

Natural Sciences, Materials Engineering, Materials Science +10