T. R. Cass

Structure of chemically deposited polycrystalline-silicon films

T. I. Kamins, T. R. Cass · Thin Solid Films · 1973 · 91 citations

Engineering, Materials Engineering, Materials Science +12

Dislocations in vapor phase epitaxial GaP

G. B. Stringfellow, P. F. Lindquist, T. R. Cass et al. · Journal of Electronic Materials · 1974 · 59 citations

Natural Sciences, Materials Science, Physics +11

Anomalous residual damage in Si after annealing of ``through-oxide'' arsenic implantations

T. R. Cass, V.G.K. Reddi · Applied Physics Letters · 1973 · 54 citations

Engineering, Materials Engineering, Materials Science +17

Crystal orientation dependence of residual disorder in As−implanted Si

Helmut Müller, W. K. Chu, J. Gyulai et al. · Applied Physics Letters · 1975 · 49 citations

Natural Sciences, Materials Engineering, Materials Science +17

Dopant redistribution during titanium silicide formation

Jun Amano, Paul Merchant, T. R. Cass et al. · Journal of Applied Physics · 1986 · 34 citations

Engineering, Electrical Engineering, Materials Science +17