S.A. Suliman

Comparison of AC and DC BTI in SiC Power MOSFETs

Amartya Ghosh, Osama O. Awadelkarim, Jifa Hao et al. · 2022 IEEE International Reliability Physics Symposium (IRPS) · 2022 · 22 citations

Engineering, Electrical Engineering, Materials Science +17

Studies of Bias Temperature Instabilities in 4H-SiC DMOSFETs

Amartya Ghosh, Jifa Hao, Michael J. Cook et al. · 2020 · 20 citations

Engineering, Electrical Engineering, Materials Science +17

Modified three terminal charge pumping technique applied to vertical transistor structures

Lucas Passmore, K. Sarpatwari, S.A. Suliman et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2005 · 12 citations · Full text

Engineering, Electrical Engineering, Microelectronics +16

Threshold-voltage bias-instability in SiC MOSFETs: effects of stress temperature and level on oxide charge buildup and recovery

Amartya Ghosh, Jifa Hao, Michael J. Cook et al. · Semiconductor Science and Technology · 2022 · 11 citations · Full text

Engineering, Electrical Engineering, Materials Science +17