B. Kaufmann

<title>Recent developments in EUV reflectometry at the Advanced Light Source</title>

Eric M. Gullikson, Stanley Mrowka, B. Kaufmann · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2001 · 100 citations

Natural Sciences, Materials Engineering, Materials Science +15

<title>Improved reflectance and stability of Mo/Si multilayers</title>

S. Bajt, Jennifer Alameda, Troy W. Barbee et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2001 · 51 citations

Engineering, Materials Engineering, Materials Science +17

Low pressure MOVPE of GaN and heterostructures

F. Scholz, V. Härle, Friedrich W. Steuber et al. · Journal of Crystal Growth · 1997 · 38 citations

Engineering, Materials Engineering, Materials Science +12

Crystal-field model of vanadium in 6H silicon carbide

B. Kaufmann, A. Dörnen, Frank S. Ham · Physical review. B, Condensed matter · 1997 · 37 citations

Natural Sciences, Chemistry, Physics +17

Low pressure metalorganic vapor phase epitaxial growth of GaN/GaInN heterostructures

F. Scholz, V. Härle, H. Bolay et al. · Solid-State Electronics · 1997 · 30 citations

Engineering, Materials Engineering, Materials Science +12