Shao-Chung Hsu

Hybrid data mining approach for pattern extraction from wafer bin map to improve yield in semiconductor manufacturing

Shao-Chung Hsu, Chen–Fu Chien · International Journal of Production Economics · 2006 · 188 citations

Engineering, Pattern Extraction, Data Science +7

A system for online detection and classification of wafer bin map defect patterns for manufacturing intelligence

Chen–Fu Chien, Shao-Chung Hsu, Ying‐Jen Chen · International Journal of Production Research · 2013 · 89 citations

Engineering, Intelligent Diagnostics, Industrial Engineering +29

A cutting algorithm for optimizing the wafer exposure pattern

Chen–Fu Chien, Shao-Chung Hsu, Jing‐Feng Deng · IEEE Transactions on Semiconductor Manufacturing · 2001 · 20 citations

Industrial Design, Wafer Scale Processing, Engineering +12

An iterative cutting procedure for determining the optimal wafer exposure pattern

Chen–Fu Chien, Shao-Chung Hsu, Chih‐Ping Chen · IEEE Transactions on Semiconductor Manufacturing · 1999 · 18 citations

Wafer Scale Processing, Engineering, Yield Management +15

DEVELOPING A DATA MINING METHOD FOR WAFER BINMAP CLUSTERING AND AN EMPIRICAL STUDY IN A SEMICONDUCTOR MANUFACTURING FAB

Chen–Fu Chien, Ting-Hao Lin, Qiao-Wen Liu et al. · Journal of the Chinese Institute of Industrial Engineers · 2002 · 10 citations