Ying‐Jen Chen

A system for online detection and classification of wafer bin map defect patterns for manufacturing intelligence

Chen–Fu Chien, Shao-Chung Hsu, Ying‐Jen Chen · International Journal of Production Research · 2013 · 89 citations

Engineering, Intelligent Diagnostics, Industrial Engineering +29

Bayesian inference for mining semiconductor manufacturing big data for yield enhancement and smart production to empower industry 4.0

Marzieh Khakifirooz, Chen–Fu Chien, Ying‐Jen Chen · Applied Soft Computing · 2017 · 85 citations

Bayesian Statistic, Engineering, Bayesian Hierarchical Modeling +9

Overlay Error Compensation Using Advanced Process Control With Dynamically Adjusted Proportional-Integral R2R Controller

Chen–Fu Chien, Ying‐Jen Chen, Chia‐Yu Hsu et al. · IEEE Transactions on Automation Science and Engineering · 2013 · 49 citations

Control Method, Engineering, Robust Control +11

An empirical study of demand forecasting of non-volatile memory for smart production of semiconductor manufacturing

Ying‐Jen Chen, Chen–Fu Chien · International Journal of Production Research · 2018 · 39 citations

Non-volatile Memory, Engineering, Industrial Engineering +18

Manufacturing intelligence for reducing false alarm of defect classification by integrating similarity matching approach in CMOS image sensor manufacturing

Ying‐Jen Chen, Chu-Yuan Fan, Kuo-Hao Chang · Computers & Industrial Engineering · 2016 · 37 citations

Image Analysis, Engineering, Data Mining +12