Chin-Shan Hou

Back-gate bias enhanced band-to-band tunneling leakage in scaled MOSFET's

Ming‐Jer Chen, Huan-Tsung Huang, Chin-Shan Hou et al. · IEEE Electron Device Letters · 1998 · 37 citations

Device Modeling, Bulk Btbt, Electrical Engineering +11

A 2-D analytic model for the threshold-voltage of fully depleted short gate-length Si-SOI MESFETs

Chin-Shan Hou, Ching‐Yuan Wu · IEEE Transactions on Electron Devices · 1995 · 34 citations

Device Modeling, Electrical Engineering, Active Silicon Film +12

Cell-based analytic statistical model with correlated parameters for intrinsic breakdown of ultrathin oxides

Ming‐Jer Chen, Huan-Tsung Huang, Jyh-Huei Chen et al. · IEEE Electron Device Letters · 1999 · 17 citations

Materials Science, Ultrathin Oxides, Electrical Engineering +15

Die cracking evaluation and improvement in ULSI plastic package

Kuo-Yu Chou, Ming‐Jer Chen, Chiu-Cheng Lin et al. · 2002 · 12 citations

Engineering, Mechanical Engineering, Reliability Engineering +18