Ching‐Chieh Shih

A Current Estimation Method for Bias-Temperature Stress of a-Si TFT Device

Ching‐Chieh Shih, Yeong-Shyang Lee, Kuo‐Lung Fang et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 22 citations

Engineering, Integrated Circuits, Silicon On Insulator +17

15.4: Excellent Performance of Indium‐Oxide‐Based Thin‐Film Transistors by DC Sputtering

Ming‐Hsien Lee, Ching‐Chieh Shih, Jim‐Shone Chen et al. · SID Symposium Digest of Technical Papers · 2009 · 16 citations · Full text

Oxide Tfts, Engineering, Excellent Performance +18

Dynamic Bias Instability of p-Channel Polycrystalline-Silicon Thin-Film Transistors Induced by Impact Ionization

Ching-Fang Huang, Hung-Chang Sun, Ying-Jhe Yang et al. · IEEE Electron Device Letters · 2009 · 16 citations

Engineering, Semiconductor Materials, Integrated Circuits +16

Improvement of Memory State Misidentification Caused by Trap-Assisted GIDL Current in a SONOS-TFT Memory Device

Te-Chih Chen, Ting‐Chang Chang, Fu-Yen Jian et al. · IEEE Electron Device Letters · 2009 · 14 citations

Polycrystalline-silicon Thin-film Transistors, Electrical Engineering, Non-volatile Memory +11