Y.T. Hou

Quantum tunneling and scalability of HfO/sub 2/ and HfAlO gate stacks

Y.T. Hou, M.F. Li, H.Y. Yu et al. · 2003 · 27 citations

Engineering, Electrical Engineering, Materials Science +17

Strain effect and channel length dependence of bias temperature instability on complementary metal-oxide-semiconductor field effect transistors with high-k/SiO2 gate stacks

Jen-Chieh Liao, Yuanxing Fang, Y.T. Hou et al. · Applied Physics Letters · 2008 · 19 citations

Engineering, Electrical Engineering, Materials Science +17

Complexity Changes in the US and China’s Stock Markets: Differences, Causes, and Wider Social Implications

Jianbo Gao, Y.T. Hou, Fangli Fan et al. · Entropy · 2020 · 17 citations · Full text

Business, Economics, Finance +16

Investigation of Bulk Traps Enhanced Gate-Induced Leakage Current in Hf-Based MOSFETs

Jen-Chieh Liao, Yean-Kuen Fang, Y.T. Hou et al. · IEEE Electron Device Letters · 2008 · 15 citations

Engineering, Electrical Engineering, Materials Science +17

45nm High-k/Metal-Gate CMOS Technology for GPU/NPU Applications with Highest PFET Performance

H.T. Huang, Y.C. Liu, Y.T. Hou et al. · 2007 · 12 citations

Engineering, Computer Engineering, Electrical Engineering +12