Lei Tang

Percolation path and dielectric-breakdown-induced-epitaxy evolution during ultrathin gate dielectric breakdown transient

Chih Hang Tung, K. L. Pey, Lei Tang et al. · Applied Physics Letters · 2003 · 102 citations

Materials Engineering, Electrical Engineering, Semiconductor Device +14

Do 3D Printing Models Improve Anatomical Teaching About Hepatic Segments to Medical Students? A Randomized Controlled Study

Xiangxue Kong, Lanying Nie, Huijian Zhang et al. · World Journal of Surgery · 2016 · 83 citations

Dynamic Gate Stress Induced Threshold Voltage Drift of Silicon Carbide MOSFET

Huaping Jiang, Xiaohan Zhong, Guanqun Qiu et al. · IEEE Electron Device Letters · 2020 · 80 citations

Electrical Engineering, Engineering, Power Device +11

Bias Temperature Instability of Silicon Carbide Power MOSFET under AC Gate Stresses

Xiaohan Zhong, Huaping Jiang, Guanqun Qiu et al. · IEEE Transactions on Power Electronics · 2021 · 75 citations

Electrical Engineering, Engineering, Gate Threshold Voltage +12

Surface passivation using ultrathin AlNx film for Ge–metal–oxide–semiconductor devices with hafnium oxide gate dielectric

Fei Gao, S. J. Lee, Jisheng Pan et al. · Applied Physics Letters · 2005 · 66 citations

Oxide Heterostructures, Materials Science, Semiconductor Technology +13