Yisong Dai

Deep-level impurity analysis for p-n junctions of a bipolar transistor from low-frequency g-r noise measurements

Yisong Dai · Solid-State Electronics · 1989 · 34 citations

Electrical Engineering, Engineering, Physics +9

1/f, g–r and burst noise used as a screening threshold for reliability estimation of optoelectronic coupled devices

Jiansheng Xu, Derek Abbott, Yisong Dai · Microelectronics Reliability · 2000 · 22 citations

Reliability, Electrical Engineering, Reliability Engineering +10

Screening and Survival Analysis of Hub Genes in Gastric Cancer Based on Bioinformatics

Shunxin Zheng, Liuhong Yang, Yisong Dai et al. · Journal of Computational Biology · 2019 · 21 citations

Optimal low-frequency noise criteria used as a reliability test for BJTs and experimental results

Yisong Dai · Microelectronics Reliability · 1991 · 20 citations

Reliability, Experimental Results, Electrical Engineering +12

The time–frequency analysis approach of electric noise based on the wavelet transform

Yisong Dai · Solid-State Electronics · 2000 · 20 citations

Time–frequency Analysis Approach, Electrical Engineering, Engineering +8