Tae-Kyun Kim

Common Mode Noise Analysis for Cascaded Boost Converter With Silicon Carbide Devices

Tae-Kyun Kim, Dong Feng, Minsoo Jang et al. · IEEE Transactions on Power Electronics · 2016 · 76 citations

Sic Mosfet, Electrical Engineering, Engineering +10

Robust ternary metal gate electrodes for dual gate CMOS devices

Dae-Gyu Park, Tae-Ho Cha, Kwan-Yong Lim et al. · 2002 · 64 citations

Low-power Electronics, Materials Science, Electrical Engineering +15

Work function and thermal stability of Ti1−xAlxNy for dual metal gate electrodes

Tae-Ho Cha, Dae-Gyu Park, Tae-Kyun Kim et al. · Applied Physics Letters · 2002 · 38 citations

Engineering, Work Function, Thin Film Process Technology +16

Effects of fluorine and chlorine on the gate oxide integrity of W/TiN/SiO2/Si metal–oxide–semiconductor structure

Dae-Gyu Park, Tae-Kyun Kim · Thin Solid Films · 2005 · 20 citations

Oxide Heterostructures, Materials Science, Semiconductor Technology +7

Highest Efficiency Plasmonic Polycrystalline Silicon Thin-Film Solar Cells by Optimization of Plasmonic Nanoparticle Fabrication

Jongsung Park, Jing Rao, Tae-Kyun Kim et al. · Plasmonics · 2013 · 17 citations

Materials Science, Plasmonics, Engineering +9