Taeyoung Kim

Statistics

Publications

Citations

675

H-Index

Active since

2010

Affiliations

University of California, Riverside(Current)

Mentor Technologies

Shanghai Jiao Tong University

University of Virginia

Karlsruhe Institute of Technology

Taeyoung Kim is an author at University of California, Riverside specializing in engineering, electrical engineering, and electromigration reliability.

ORCID

Publications per year

2010–2017

Publications

Multi-beam transmission diversity with hybrid beamforming for MIMO-OFDM systems

Chan-Hong Kim, Taeyoung Kim, Ji‐Yun Seol · 2013 · 136 citations

Engineering, Communication, Electrical Engineering +17

Analytical Modeling and Characterization of Electromigration Effects for Multibranch Interconnect Trees

Hai‐Bao Chen, Sheldon X.-D. Tan, Xin Huang et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2016 · 72 citations

Engineering, Computer Engineering, Electrical Engineering +17

Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited)

Sheldon X.-D. Tan, Taeyoung Kim, Zeyu Sun et al. · Integration · 2017 · 47 citations

Engineering, Electrical Engineering, Systems Engineering +14

Battery Management and Application for Energy-Efficient Buildings

Tianshu Wei, Taeyoung Kim, Sangyoung Park et al. · 2014 · 44 citations

Engineering, Building Science, Energy Management +16

Analytical Modeling of Electromigration Failure for VLSI Interconnect Tree Considering Temperature and Segment Length Effects

Hai‐Bao Chen, Sheldon X.-D. Tan, Jiangtao Peng et al. · IEEE Transactions on Device and Materials Reliability · 2017 · 44 citations

Engineering, Computer Engineering, Electrical Engineering +17

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