Kaito Hikake

Statistics

Publications

Citations

H-Index

Active since

2023

Affiliations

Nara Institute of Science and Technology(Current)

The University of Tokyo

Kaito Hikake is an author at Nara Institute of Science and Technology specializing in semiconductor reliability, gate oxide reliability, and microelectronics.

ORCID

Publications per year

2023–2024

Publications

A Nanosheet Oxide Semiconductor FET Using ALD InGaOx Channel for 3-D Integrated Devices

Kaito Hikake, Zhuo Li, Junxiang Hao et al. · IEEE Transactions on Electron Devices · 2024 · 30 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

A Nanosheet Oxide Semiconductor FET Using ALD InGaOx Channel and InSnOx Electrode with Normally-off Operation, High Mobility and Reliability for 3D Integrated Devices

Kaito Hikake, Zhuo Li, Junxiang Hao et al. · 2023 · 17 citations

Engineering, Electrical Engineering, Materials Science +15

High-Field Transport and Statistical Variability of Nanosheet Oxide Semiconductor FETs With Channel Length Scaling

Xingyu Huang, Kaito Hikake, Sunghun Kim et al. · IEEE Transactions on Electron Devices · 2024 · 13 citations · Full text

Engineering, Electrical Engineering, Materials Engineering +17

1–3 of 3