S. Harasek

ZrO₂/(Al)GaN metal–oxide–semiconductor structures: characterization and application

J. Kuzmı́k, S. Harasek, Ha ík et al. · Semiconductor Science and Technology · 2004 · 35 citations

Engineering, Electrical Engineering, Materials Science +17

Quantitative scanning capacitance spectroscopy

W. Brezna, M. Schramboeck, Alois Lugstein et al. · Applied Physics Letters · 2003 · 29 citations

Natural Sciences, Materials Science, Physics +17

Structural properties of Y2O3 thin films grown on Si(100) and Si(111) substrates

M. Španková, I. Vávra, Š. Chromík et al. · Materials Science and Engineering B · 2004 · 23 citations

Natural Sciences, Materials Engineering, Materials Science +14

Metal-organic chemical vapor deposition and nanoscale characterization of zirconium oxide thin films

S. Harasek, Heinz D. Wanzenboeck, B. Basnar et al. · Thin Solid Films · 2002 · 20 citations

Natural Sciences, Materials Engineering, Materials Science +16

Compositional and electrical properties of zirconium dioxide thin films chemically deposited on silicon

S. Harasek, Heinz D. Wanzenboeck, E. Bertagnolli · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2003 · 20 citations

Natural Sciences, Materials Engineering, Materials Science +17