Ultrafast VLS growth of epitaxial β- Ga₂O₃nanowires

Erwin Auer, Alois Lugstein, Stefan Löffler, +4

Nanotechnology

Materials ScienceEngineeringNanomaterialsNanotechnologySurface Science +12

Quantitative scanning capacitance spectroscopy

W. Brezna, M. Schramboeck, Alois Lugstein, +5

Applied Physics Letters

EngineeringMicroscopyElectron MicroscopyNanometrologyInstrumentation +15

Bridging the gap—Biocompatibility of microelectronic materials

Elisabeth Bogner, K. Dominizi, P. Hagl, +5

Acta Biomaterialia

Materials ScienceEngineeringMicroelectronic MaterialsBioelectronicsBiomedical Engineering +3

Charge Transport Through Thin Amorphous Titanium and Tantalum Oxide Layers

Kevin Stella, Domocos Kovacs, Detlef Diesing, +2

Journal of The Electrochemical Society

EngineeringTitanium OxideCharge TransportSemiconductor DeviceNanoelectronics +14

Scanning capacitance microscopy with ZrO2 as dielectric material

W. Brezna, S. Harasek, E. Bertagnolli, +3

Journal of Applied Physics

Materials ScienceZro2 LayersElectrical EngineeringEngineeringElectron Microscopy +13

Tip geometry effects in scanning capacitance microscopy on GaAs Schottky and metal-oxide-semiconductor-type junctions

Christian Eckhardt, W. Brezna, Ole Bethge, +2

Journal of Applied Physics

Tip Geometry EffectsElectrical EngineeringSemiconductor DeviceEngineeringPhysics +12

Psychophysical Vision Simulation of Diffractive Bifocal and Trifocal Intraocular Lenses

W. Brezna, Kirsten Lux, Nikolaus Dragostinoff, +8

Translational Vision Science & Technology

Visual Outcomes and Patient Satisfaction After Bilateral Sequential Implantation of a Capsular Bag IOL and a Supplementary Sulcus-Fixated Trifocal IOL

Guenal Kahraman, Nikolaus Dragostinoff, W. Brezna, +2

Journal of Refractive Surgery

Direct-write deposition with a focused electron beam

Markus Fischer, Heinz D. Wanzenboeck, Josef Gottsbachner, +4

Microelectronic Engineering

Focused Electron BeamElectron-beam LithographyBeam LithographyApplied PhysicsElectron Optic

High resolution photocurrent imaging by atomic force microscopy on the example of single buried InAs quantum dots

M. Madl, W. Brezna, P. Klang, +3

Semiconductor Science and Technology

Atomic Force MicroscopyOptical MaterialsEngineeringMicroscopyColloidal Nanocrystals +21