D. Wolany

<i>In situ</i> ToF‐SIMS/XPS investigation of nitrogen plasma‐modified polystyrene surfaces

F. Petrat, D. Wolany, B. C. Schwede et al. · Surface and Interface Analysis · 1994 · 71 citations

Materials Science, Chemical Engineering, Abstract Plasma Modification +13

Combined ToF‐SIMS/XPS study of plasma modification and metallization of polyimide

D. Wolany, Thorsten Fladung, Lothar Duda et al. · Surface and Interface Analysis · 1999 · 44 citations

Engineering, Chemistry, Plasma Processing +17

Comparative <i>in situ</i> ToF‐SIMS/XPS study of polystyrene modified by argon, oxygen and nitrogen plasmas

F. Petrat, D. Wolany, B. C. Schwede et al. · Surface and Interface Analysis · 1994 · 38 citations

Engineering, Plasma Physics, Chemistry +22

Analysis of stoichiometry and oxide growth of HF treated GaAs (100) by x-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

W. Storm, D. Wolany, Florian Schröder et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1994 · 21 citations

Engineering, Oxidation Resistance, Oxide Electronics +15

Molecular weight determination of bulk polymer surfaces by static secondary ion mass spectrometry

Karsten Reihs, Matthias Voetz, M. Kruft et al. · Fresenius Journal of Analytical Chemistry · 1997 · 13 citations

Materials Science, Polymer Material, Engineering +12