James E. Johnstone

Quantification issues in ToF‐SSIMS and AFM co‐analysis in two‐phase systems, exampled by a polymer blend

Ian S. Gilmore, M. P. Seah, James E. Johnstone · Surface and Interface Analysis · 2003 · 28 citations

Natural Sciences, Materials Engineering, Materials Science +17

Cones formed during sputtering of InP and their use in defining AFM tip shapes

M. P. Seah, Steven J. Spencer, P. J. Cumpson et al. · Applied Surface Science · 1999 · 22 citations

Natural Sciences, Materials Engineering, Materials Science +12

Sputter-induced cone and filament formation on InP and AFM tip shape determination

M. P. Seah, Steven J. Spencer, P. J. Cumpson et al. · Surface and Interface Analysis · 2000 · 16 citations

Natural Sciences, Materials Science, Physics +17

Depth resolution in sputter depth profiling-characterization of a third batch of tantalum pentoxide on tantalum certified reference material by AES and SIMS

M. P. Seah, Steven J. Spencer, Ian S. Gilmore et al. · Surface and Interface Analysis · 2000 · 12 citations

Natural Sciences, Materials Engineering, Materials Science +10

MuSIC@Indiana: An effective tool for accurate measurement of fusion with low-intensity radioactive beams

James E. Johnstone, Rohit Kumar, S. Hudan et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2021 · 11 citations · Full text

Engineering, Nuclear Engineering, Physics +14