T. Tokuda

A built-in self-test for ADC and DAC in a single-chip speech CODEC

E. Teraoka, T. Kengaku, Ikuo Yasui et al. · 2002 · 79 citations

Engineering, Analog Design, Analog Verification +19

Fuzzy inference and fuzzy inference processor

Kazuo Nakamura, N. Sakashita, Y. Nitta et al. · IEEE Micro · 1993 · 62 citations

Artificial Intelligence, Fuzzy Systems, Engineering +18

Delay-Time Modeling for ED MOS Logic LSI

T. Tokuda, Kaoru Okazaki, K. Sakashita et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1983 · 34 citations

Logic Synthesis, Propagation Delay Time, Electrical Engineering +14

Built-in self-test in a 24 bit floating point digital signal processor

N. Sakashita, Hiroko Sawai, E. Teraoka et al. · 2002 · 12 citations

Engineering, Vlsi Design, Measurement +18

A 12 b resolution 200 kFLIPS fuzzy inference processor

Kazuo Nakamura, N. Sakashita, Y. Nitta et al. · 1993 · 11 citations

Fuzzy Systems, Vlsi Design, Engineering +21