Akira Yoshinaka

Shrinkage and annihilation of stacking faults in silicon

Yusuke Sugita, Hirofumi Shimizu, Akira Yoshinaka et al. · Journal of Vacuum Science and Technology · 1977 · 30 citations

Natural Sciences, Materials Engineering, Materials Science +14

A Defect Control Technique for the Intrinsic Gettering in Silicon Device Processing

Seigô Kishino, Takaaki Aoshima, Akira Yoshinaka et al. · Japanese Journal of Applied Physics · 1984 · 23 citations

Engineering, Materials Engineering, Materials Science +17

Voids in Quenched Gold

Sho Yoshida, Michio Kiritani, Yoshiharu Shimomura et al. · Journal of the Physical Society of Japan · 1965 · 17 citations

Natural Sciences, Materials Science, Physics +6

Nature of Black Spot Defects in Quenched Gold

Akira Yoshinaka, Yoshiharu Shimomura, Michio Kiritani et al. · Japanese Journal of Applied Physics · 1968 · 15 citations

Natural Sciences, Materials Science, Surface Science +3

Formation of a Stacking Fault-Free Region in Thermally Oxidized Silicon

Hirofumi Shimizu, Akira Yoshinaka, Yoshimitsu Sugita · Japanese Journal of Applied Physics · 1978 · 13 citations

Natural Sciences, Materials Engineering, Materials Science +17